Accelerated Testing of Metal Foil Tape Joints and Their Effect on Photovoltaic Module Reliability

نویسندگان

  • N. Robert Sorensen
  • Michael A. Quintana
  • Michael J. Mundt
  • Edward V. Thomas
  • Steven P. Miller
  • Samuel J. Lucero
چکیده

A program is underway at Sandia National Laboratories to predict long-term reliability of photovoltaic (PV) systems. The vehicle for the reliability predictions is a system performance model, currently being run under a simulation software called GoldSimTM. The model includes inputs for module performance, irradiance, and degradation. In order to be truly predictive, physics-informed degradation processes and failure mechanisms need to be included in the model. This paper describes accelerated life testing of metal foil tapes used in thin-film PV modules, and how tape joint degradation, a possible failure mode, can be incorporated into the model.

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تاریخ انتشار 2010